Technical specifications Control modes: Force, Displacement
Useable Min./Max. Load: <5 nN / >10mN
Useable Noise-floor/Max. Displacement: <0.1 nm / >20 um
Controllable oscillator drive frequency: 1 – 300 Hz
Specimen holders: Vacuum, Magnetic, Gravity, mechanical clamping
Probes: Conical, Flat, Berkovich, Cube, custom sizes and shapes
Advanced loading techniques Quasi-static indentation:
- Trapezoid
- Multiple partial unloading
- Stiction
- Creep
- Grid
Dynamic indentation:
- Variable load
- Variable frequency
- Continuous stiffness
- Modulus mapping
Nano-scratch:
- Constant load
- Progressive load
- Tilt corrected multi-pass
In-situ imaging:
- Contact mode
- (Scanning-) wear