- Non-destructive way to detect defects within a sealed device
- Screening of production electronic components to military standards
- Outstanding application for Failure Analysis investigations
- Client witnessed live Radiographic Inspection
RTX uses high energy X-rays to look through samples and shows a density map of the device, click here to view samples of these images. It is very useful for examining components not visible on the exterior of the sample: bond wires, die size, solder connections, and other components.
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