技术

如下所示的EAG SMART(光谱学和显微镜分析分辨率工具)图为比较分析技术提供了简洁的视觉参考。 轻松比较用于材料表征,评估表面分析,纯度调查等数十种技术的检测极限和分析分辨率! 选择一种技术以了解更多信息或 与EAG科学家联系。 查看我们的 SMART Chart网络研讨会系列获取海报大小的EAG SMART Chart!

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FIB SEM SEM-CL TOF-SIMS Dynamic SIMS LA- ICPMS TXRF RBS XRF FTIR XRD XPS/ ESCA Raman SEM/ EDS Auger STEM/ EDS STEM/ EELS Atom Probe XRR DHEM Ellipsometry GDMS ICP Techniques GC-MS, LC-MS IGA IC TGA/DTA/DSC NMR GPC AFM TEM/STEM EBIC OP RTX Nanoindentation ETV-ICP-OES LIBS EBSD Elemental informationImaging informationElemental and imaging informationPhysical and/or optical propertiesThickness and density information Chemical bonding/molecular/structural informationElectrical (active dopant and mobility) information © 1995-2019 Eurofins EAG Materials Science. All Rights Reserved.

所有技术

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