Advanced microscopy techniques such as SEM (Scanning Electron Microscopy) and TEM (Transmission Electron Microscopy) are essential techniques to investigate sample microstructure, morphology, particle size, particle coatings and defects. These techniques often employ elemental mapping capabilities such as EELS (Electron Energy Loss Spectroscopy) and EDS (Energy Dispersive X-Ray Spectroscopy) which provide valuable information about elemental composition and location/distribution.
EAG offers a broad range and large installed base of different microscopy tools and services to match your application, ranging from process development to failure analysis. In addition to providing high resolution imaging, our analytical capability makes us a unique partner that can help you during research, development, and analysis of failures.
Microscopy techniques can be used to characterize many types of defects. These include:
The types of materials tested using advanced microscopy techniques:
To enable certain features and improve your experience with us, this site stores cookies on your computer. Please click Continue to provide your authorization and permanently remove this message.