Electron Back Scatter Diffraction (EBSD) uses the electron beam of an SEM to provide a nanoscale look at a material’s microstructure–providing insight into critical properties such as fatigue, fracture strength, corrosion resistance, creep, ductility, and hardness.

EAG continues to add new analytic functionality to help customers with a need for particle analysis to better identify and measure across a wide dispersion of particles. Automotive, aerospace, and semiconductor manufacturers can rely on EAG’s scientific expertise to provide comprehensive reporting with this new feature.

The EAG SMART (Spectroscopy and Microscopy Analytical Resolution Tool) Chart offers a concise visual reference for comparing analytical techniques. Easily compare the detection limits and analytical resolutions of dozens of techniques used for materials characterization, evaluation surface analysis, purity surveys and more!